PolyU research overcomes major obstacle to solar technology development, achieving record 33.89% power-conversion efficiency in solar cells (IMAGE)
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a,b, ToF-SIMS three-dimensional map distribution of LiF-related (a) and EDAI-related (b) charged fragments for the LiF/EDAI bilayer-treated perovskite films followed by C60 and SnO2 deposition fabricated on textured silicon substrate. c, Schematic of the perovskite/ETL interface structure with LiF/EDAI bilayer passivation. d–f, Cross-sectional KPFM amplitude images for the perovskite subcells on a textured silicon substrate for the unpassivated (d), LiF-treated (e) and LiF/EDAI-bilayer-treated (f) devices. The electrical-field distribution along the lateral direction of a pyramid valley area and a spire area were directly plotted on the graphs. Scale bars, 500 nm. g,h, XPS spectra of the Pb4f (g) and N1s (h) core levels for the bare perovskite film and passivated films. i,j, VB edge region (i) and photoelectron cut-off region (j) for the bare perovskite and EDAI-treated perovskite films with and without a 3 nm C60 capping layer. All the samples were deposited on IZO/Self-Assembled Monolayers (SAMs)-coated c-Si substrates.
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