Figure 4 (IMAGE)

Light Publishing Center, Changchun Institute of Optics, Fine Mechanics And Physics, CAS

Figure 4

Caption

Figure 4 | Defect characterization of CNPs in PEEM. a and b, SEM (a) and PEEM images (b) of a typical CNP array. c, Calculated cross-sectional electric field of nanoslit mode. c, Sectional HR-TEM image of the sample in a. The bottom row is a close-up sectional HR-TEM image around the slits.

Credit

Limin Tong et al.

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License

CC BY

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