Figure 3 High-resolution transmission electron microscopy (HRTEM) analysis of ZnBiP electrode (IMAGE)

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Expert Contacts

Yi Xiong
Analytical and Testing Center, School of Bioengineering and Health, School of Electronics and Electrical Engineering, Hubei Provincial Engineering Research Center for Wide-Bandgap Semiconductor Materials and Devices, Wuhan Textile University, Wuhan, 430073, Hubei, China.
xiong@wtu.edu.cn

Yun Tang
Analytical and Testing Center, School of Bioengineering and Health, School of Electronics and Electrical Engineering, Hubei Provincial Engineering Research Center for Wide-Bandgap Semiconductor Materials and Devices, Wuhan Textile University, Wuhan, 430073, Hubei, China.
ytang@wtu.edu.cn

Shuoxue Jin
Multi-disciplinary Research Division, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China.
jinshuoxue@ihep.ac.cn

Figure 3 High-resolution transmission electron microscopy (HRTEM) analysis of ZnBiP electrode (IMAGE)

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