Figure 3. Theoretical validation of defect signal enhancement via the photothermal effect. (IMAGE)
Caption
Figure 3. Theoretical validation of defect signal enhancement via the photothermal effect. a: Simulated far-field image and its corresponding reference differential image of a nanostructure with a cutting defect at room temperature (25°C). b: Simulated far-field image and its reference differential image for the same nanostructure at an elevated temperature (500°C), demonstrating the enhanced defect contrast.
Credit
Prof. Jinlong Zhu et al.
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CC BY