Figure 1 (IMAGE)

Advanced Institute for Materials Research (AIMR), Tohoku University

Figure 1

Caption

High-throughput analysis. Schematic illustration of the plating/stripping behavior of bare Mg (a) and Mg alloys (b). (c) Workflow for high-throughput screening of Mg binary compounds. (d) Number of Mg binary compounds formed with element X in the Materials Project database. Green boxes indicate systems with larger numbers of stable intermetallic phases, while white boxes indicate systems unable to form a stable second phase.

Credit

Qian Wang et al.

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CC BY

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