Illustrations (IMAGE)
Caption
The left schematic illustrates the in situ tensile four-dimensional scanning transmission electron microscopy (4D-STEM) technique. The right panels compare the single-crystalline diamond microbridge at an unstrained state and under straining (8.9%), showing the sample-wide strain maps and the corresponding nanobeam electron diffraction patterns, confirming the uniform pure lattice elongation across the entire diamond bridge.
Credit
The University of Hong Kong
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Original content