KAIST Identifies Cause of Artifacts in Battery Nanoscale Analysis, Paving the Way for More Reliable Measurements (IMAGE)

The Korea Advanced Institute of Science and Technology (KAIST)

KAIST Identifies Cause of Artifacts in Battery Nanoscale Analysis, Paving the Way for More Reliable Measurements

Caption

Figure 1. Schematic illustrating the trace–retrace discrepancy observed in DART-ESM measurements.

Credit

KAIST

Usage Restrictions

No

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.