KAIST Identifies Cause of Artifacts in Battery Nanoscale Analysis, Paving the Way for More Reliable Measurements (IMAGE)

The Korea Advanced Institute of Science and Technology (KAIST)

KAIST Identifies Cause of Artifacts in Battery Nanoscale Analysis, Paving the Way for More Reliable Measurements

Caption

Figure 2. AFM images of an NZTO solid electrolyte for sodium-ion batteries, comparing samples mechanically polished with sandpaper and samples after CCP treatment. After CCP treatment, the standard deviation of the ESM amplitude decreases, and the consistency between amplitude trace and retrace improves.

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KAIST

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