Figure 2. (IMAGE)

Advanced Devices & Instrumentation

Figure 2.

Caption

Figure 2. Average PSD at the LNA output and quantum-to-classical noise clearance characterization. (A) Average PSD for varying LO power with electronic noise floor. (B) PSD stability measured at 4-hour intervals. (C) Average PSD measured at 200 MHz for different incident LO powers.

Credit

Advanced Devices & Instrumentation

Usage Restrictions

News organizations may use or redistribute this image, with proper attribution, as part of news coverage of this paper only.

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.