Figure 2 (IMAGE)

Tohoku University

Figure 2

Caption

(a) Cross-sectional SEM image of the PF-L0 sample. (b) Optical microscopy image of PF-L0 showing interference colors. (c) TEM image of the PF-L5 sample showing the absorbing material deposited on its surface. (d) HRTEM image of the absorber (FeOOH) on the PF-L5 substrate and the corresponding fast Fourier transform (FFT) pattern (the lattice planes of FeOOH are highlighted in yellow). (e) Optical microscopy image of PF-L5 showing interference colors. 

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Shu Yin et al.

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