From static snapshots to nanoscale X-ray mapping: how perovskite characterization has evolved (IMAGE)

Science China Press

From static snapshots to nanoscale X-ray mapping: how perovskite characterization has evolved

Caption

Timeline of the main X-ray scattering techniques applied to perovskites, from ex situ X-ray diffraction after perovskites were first used in solar cells in 2009, through static GIWAXS, in situ GIWAXS during film deposition and operando GIWAXS under device operating conditions, to nano-focused wide-angle X-ray scattering.

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