Figure 2. (IMAGE)

Skolkovo Institute of Science and Technology (Skoltech)

Figure 2.

Caption

CNT-nanocomposites being tested for piezoresistive response in an Intron 5969 Universal Testing Systems under tensile load. The values of resistance change as increasing tensile load is applied which allow the material to send a self-report as to its condition. The silver lines are conductive contacts and the white speckles are used by the LIMESS digital image correlation (DIC) system to calculate strain values.

Credit

The image was taken in the Laboratory of Mechanical Testing, CDMM at Skoltech.

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