Electron Trap System (IMAGE)

Okinawa Institute of Science and Technology (OIST) Graduate University

Electron Trap System

Caption

Images of the electron trap architecture. Top: Schematic representation of the experiment. Current of surface electrons, induced by ac voltage applied to the electrode underneath Reservoir 1, flows between Reservoirs 1 and 4, as shown by the red arrow. Middle: Cross section of the central microchannel around the gate area. Bottom: Photograph of the microchannel device on a copper sample cell, with subsequent close-up photographs of the central channel and surrounding reservoirs.

Credit

Denis Konstantinov

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