Instrument (IMAGE) DOE/Argonne National Laboratory Caption Researchers used this instrument to observe the nanowire defects discussed in this study. It is designed to deliver novel X-ray capabilities that bring researchers closer to the goal of observing materials at nanometer resolution. Credit Brookhaven National Laboratory Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.