Nanoscale Dimensioning Is Fast, Cheap with New NIST Optical Technique (2 of 2) (IMAGE)

National Institute of Standards and Technology (NIST)

Nanoscale Dimensioning Is Fast, Cheap with New NIST Optical Technique (2 of 2)

Caption

Using an optical microscope, several images of a 60 nanometer gold particle sample are taken at different focal positions and stacked together. This computer-created image shows the resultant TSOM image.

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NIST

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