Nanoscale Dimensioning Is Fast, Cheap with New NIST Optical Technique (1 of 2) (IMAGE)

National Institute of Standards and Technology (NIST)

Nanoscale Dimensioning Is Fast, Cheap with New NIST Optical Technique (1 of 2)

Caption

This schematic shows how a TSOM image is acquired. Using an optical microscope, several images of a 60 nanometer gold particle sample (shown in red) are taken at different focal positions and stacked together.

Credit

NIST

Usage Restrictions

None

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.