Experiment Setup (IMAGE)
Caption
A series of nanowires were scanned in the nanofocused X-ray, while the reflections from the different crystal planes of the nanowires were measured. The location of the reflections provides information about tilt and deformations in the nanowires
Credit
Credit: Tomas Stankevic, Niels Bohr Institute, University of Copenhagen.
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Credit: Tomas Stankevic, Niels Bohr Institute, University of Copenhagen.
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