Figure 2: Measured Reflectance Spectra (IMAGE)
Caption
Figure 2. (a) Measured reflectance spectra in each of deposition angles (DAs) (i.e., 0°, 30°, 45° and 70°) with different Ge thicknesses (i.e., 10 nm, 15 nm, 20 nm and 25 nm). (b) Chromatic values in the CIE coordinate from measured reflectance as shown in (a). Chromatic values for ultra-thin films with four different Pr (i.e., 0%, 40%, 60% and 75%) are also shown by dash lines for comparison. (c) Pictures of the fabricated samples of different DAs (i.e., 0°, 30°, 45° and 70°) with different Ge thicknesses (i.e., 10 nm, 15 nm, 20 nm, 25 nm and 100 nm). Left, gray-scale figures show scanning microscopy images corresponding to the samples with Ge thickness of 200 nm to better show the morphology.
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