Hexagonal Silicon Phase (IMAGE) Lobachevsky University Caption This is an electron microscopic image of the layer of the hexagonal silicon phase at the interface with the irradiated SiO2 film (a) and the pattern of diffraction reflexes obtained using the Fourier transform of the selected region (b). Credit Lobachevsky University Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.