2 Infrared Beams, 1 Atomic Force Microscope (IMAGE)

DOE/Lawrence Berkeley National Laboratory

2 Infrared Beams, 1 Atomic Force Microscope

Caption

Infrared light (pink) produced by Berkeley Lab's Advanced Light Source synchrotron (upper left) and a conventional laser (middle left) is combined and focused on the tip of an atomic force microscope (gray, lower right), where it is used to measure nanoscale details in a crystal sample (dark red).

Credit

Berkeley Lab, CU-Boulder

Usage Restrictions

None

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.