Micrographs of a Spot of Electronics Solder (IMAGE)

National Institute of Standards and Technology (NIST)

Micrographs of a Spot of Electronics Solder

Caption

Micrographs of a spot of electronics solder demonstrate how the lithium FIB microscope (left) clearly distinguishes between the lead and tin components. An SEM image (right) captures mainly topological differences. Images show a region approximately 28 micrometers across.

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Twedt/CNST

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