Configuration of the Inverted Scanning Force Microscope (IMAGE)

ETH Zurich Department of Physics

Configuration of the Inverted Scanning Force Microscope

Caption

A perforated silicon nitride membrane serves as force sensor. Two coupled 'islands' undergo out-of-plane vibrations. On one of them the samples are loaded and the other is used to measure the vibrations with a laser interferometer. A metallic scanning tip interacts with the samples and modifies the vibrations.

Credit

Alexander Eichler, ETH Zurich

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