Noncontact Atomic Force Microscope (IMAGE)

DOE/Lawrence Berkeley National Laboratory

Noncontact Atomic Force Microscope

Caption

The single-atom tip of the noncontact atomic force microscope "feels" changes in the strength of electronic forces as it moves across the surface at a constant height. Resulting movements of the stylus are detected by a laser beam to compute images.

Credit

Lawrence Berkeley National Laboratory and University of California at Berkeley

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