Degertekin AFM (IMAGE) Georgia Institute of Technology Research News Caption Levent Degertekin (left), a professor in the George W. Woodruff School of Mechanical Engineering at Georgia Tech, shows the adapted AFM holder while graduate student Guclu Onaran points to an image of the FIRAT probe scanning a sample. The front monitor displays the topography of a sample obtained by the FIRAT probe at a speed of 2 frames per second, which is nearly 100 times faster than the normal speed. Credit Georgia Tech Photo: Gary Meek Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.