Single Crystal Sample -- 2 (IMAGE) Georgia Institute of Technology Caption A single crystal sample is loaded onto the measurement stage of a modified atomic force microscope (i.e. piezoresponse force microscope). Credit Rob Felt, Georgia Tech Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.