Single Crystal Sample (IMAGE) Georgia Institute of Technology Caption Georgia Tech Ph.D. Candidate Lee Griffin places the single crystal sample onto the measurement stage of the modified atomic force microscope (i.e. piezoresponse force microscope). Credit Rob Felt, Georgia Tech Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.