Schematic Representation of OIST Experiment with Electrons (IMAGE)

Okinawa Institute of Science and Technology (OIST) Graduate University

Schematic Representation of OIST Experiment with Electrons

Caption

Schematic representation of the experiment. A rotating microwave field (E) is sent through a circular layer of electrons while their electrical current (I) is measured by applying voltage (V).

Credit

OIST

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Free for anyone to re-use, but must be credited to OIST. This work is licensed under a Creative Commons Attribution 2.0 Generic License.

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