MIT's Braatz and Stanford's Chueh (IMAGE) Stanford University Caption MIT professor Richard Braatz, left, and William Chueh, assistant professor in materials science and engineering at Stanford, led researchers who developed a better battery testing technique. Credit Amos Enshen Lu Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.