3-D Assemblies (IMAGE) DOE/Brookhaven National Laboratory Caption This image shows the range of multilayer morphologies achieved through this new technique. The first column shows a cross section of the novel 3-D nanostructures as captured by scanning electron microscopy (SEM). The computer renderings in the second column highlight the integrity and diversity of each distinct layer, while the overhead SEM view of the third column reveals the complex patterns achieved through the "intelligent" layering. Credit Brookhaven National Laboratory Usage Restrictions OK for use with stories about this research License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.