Amar Tests First-Passage-Time/KMC Approach (IMAGE)
Caption
The University of Toledo’s Jacques Amar, Ph.D., leveraged Ohio Supercomputer Center systems to test an accelerated approach to simulating thin film growth. Using two different models (fcc and SOS), Amar compared the regular Kinetic Monte Carlo method (figures A and C) with a first-passage-time approach coupled with the KMC method (figures B and D).
Credit
Amar/University of Toledo
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