Switching Error Rate (IMAGE)

Tohoku University

Switching Error Rate

Caption

This image shows the experimentally obtained switching error rate as a function of applied current density for two devices with different material systems. Duration of current pulse is 0.5 ns. For both materials, 500-times switching for 500-times trial is obtained with a sufficiently small current density.

Credit

Shunsuke Fukami

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Credit: Shunsuke Fukami

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