In Situ Ultrahigh Temperature Tensile Test Rig for Synchrotron X-Ray Computed Microtomography (IMAGE)

DOE/Lawrence Berkeley National Laboratory

In Situ Ultrahigh Temperature Tensile Test Rig for Synchrotron X-Ray Computed Microtomography

Caption

This is a schematic illustration of the in situ ultrahigh temperature tensile test rig for synchrotron X-ray computed microtomography now being used at Beamline 8.3.2 of Berkeley Lab's Advanced Light Source.

Credit

Courtesy of Robert Ritchie, Berkeley Lab

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