Measuring nanoparticles (VIDEO) Optica This video is under embargo. Please login to access this video. To view this video please enable JavaScript, and consider upgrading to a web browser that supports HTML5 video Caption A newly developed sub-diffraction-limit microscopy approach doesn’t require fluorescent labels. The video shows the process of the data evaluation algorithm, retrieving the positions and sizes of all nanoparticles in the viewed area. Credit Jörg S. Eismann, University of Graz Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.