Figure 2 (IMAGE)
Light Publishing Center, Changchun Institute of Optics, Fine Mechanics And Physics, CAS
a. Scanning electron microscopy image of a NW placed on a SiO2/Si substrate. b. Normalized spectra of the fundamental lasing mode (1016 nm) and the frequency-doubled lasing mode (508 nm). c. Polarization dependence of the frequency-doubled lasing mode (blue dots) and its theoretical prediction (blue line), where the corresponding polarization dependence of the fundamental lasing mode is also shown (red dots for experimental results and red line for theoretical calculation). d. Dependence of the fundamental lasing mode and the frequency-doubled lasing mode intensities, showing a fitting slope 1.980.01 on a log-log scale.
by Ruixuan Yi, Xutao Zhang, Chen Li, Bijun Zhao, Jing Wang, Zhiwen Li, Xuetao Gan, Li Li, Ziyuan Li, Fanlu Zhang, Liang Fang, Naiyin Wang, Pingping Chen, Wei Lu, Lan Fu, Jianlin Zhao, Hark Hoe Tan, and Chennupati Jagadish
Credit must be given to the creator.
Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.