image: At left: An as-captured convergent beam electron diffraction (CBED) pattern from aluminum near [110]. At right: The angular difference pattern obtained from the as-captured CBED pattern at left. This image relates to an article that appeared in the March 25, 2011, issue of Science, published by AAAS. The study, by Dr. Philip Nakashima, at Monash University in Clayton, VIC, Australia, and colleagues was titled, "The Bonding Electron Density in Aluminum." view more
Credit: [Image © <i>Science/</i>AAAS]