Examining Silicon Germanium Chip 2 (IMAGE)

Georgia Institute of Technology

Examining Silicon Germanium Chip 2

Caption

Georgia Tech Professor John Cressler and Phd student Ram Krithivasan examine a silicon germanium chip inside a cryogenic test station at the Georgia Electronic Design Center at Georgia Tech in Atlanta. IBM and Georgia Tech have announced that they have broken the world silicon speed record with a chip that operates at half a trillion cycles per second, some 250 times faster than chips found in conventional cell phones.

Credit

Georgia Tech Photo: Gary Meek

Usage Restrictions

None

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.