Examining Silicon Germanium Chip 2 (IMAGE) Georgia Institute of Technology Caption Georgia Tech Professor John Cressler and Phd student Ram Krithivasan examine a silicon germanium chip inside a cryogenic test station at the Georgia Electronic Design Center at Georgia Tech in Atlanta. IBM and Georgia Tech have announced that they have broken the world silicon speed record with a chip that operates at half a trillion cycles per second, some 250 times faster than chips found in conventional cell phones. Credit Georgia Tech Photo: Gary Meek Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.