Preparation for Analysis in a Time-Of Flight Secondary Ion Mass Spectrometer (IMAGE)

Chalmers University of Technology

Preparation for Analysis in a Time-Of Flight Secondary Ion Mass Spectrometer

Caption

Chemists Lina Hagvall and Per Malmberg prepare samples for analysis in the time-of flight secondary ion mass spectrometer (ToF-SIMS). During analysis the samples are inserted into the test chamber using the test arm shown at the bottom of the picture.

Credit

Mats Tiborn

Usage Restrictions

None

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.