Test Chamber in Time-Of-Flight Secondary Ion Mass Spectrometer (IMAGE)

Chalmers University of Technology

Test Chamber in Time-Of-Flight Secondary Ion Mass Spectrometer

Caption

Test chamber in the time-of-flight secondary ion mass spectrometer (ToF-SIMS) in which the skin samples are exposed to ion beams. The samples are analysed in an ultra-high vacuum to avoid disruption.

Credit

Mats Tiborn

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