NanoSIMS images of a SiC grain (IMAGE) Washington University in St. Louis Caption NanoSIMS images of a SiC grain. The upper panel shows images taken at a spatial resolution of ~1 μm, the typical resolution of previous analyses. The lower panel shows the same grain’s ion images taken at a spatial resolution of 100 nm, the resolution achieved in this study. Credit Image courtesy of Nan Liu Usage Restrictions For editorial purposes License Original content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.