(IMAGE) Kumamoto University Caption (a) Measured data, (b) Result after sparse modeling, (c) Residual of the result by sparse modeling of the measured data. Akai, I., Iwamitsu, K., Igarashi, Y., Okada, M., Setoyama, H., Okajima, T., & Hirai, Y. (2018). Sparse Modeling of an Extended X-Ray Absorption Fine-Structure Spectrum Based on a Single-Scattering Formalism. Journal of the Physical Society of Japan, 87(7), 074003. doi:10.7566/jpsj.87.074003 Credit Dr. Ichiro Akai Usage Restrictions This image is available under the terms of the <a href= License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.