“Breaking the ultra-thin dilemma”: Contact resistance drops 50×, on-state current increases 17×
Peer-Reviewed Publication
Updates every hour. Last Updated: 30-Oct-2026 08:17 ET (30-Oct-2026 12:17 GMT/UTC)
POSTECH Research Team Led by Prof. Byoung Hun Lee Overcomes Performance Limits of Ultra-Thin Semiconductors with a Novel Localized Thick-Contact Desig.
Researchers developed self-expanding 4D-printed implants that could reduce injections, surgeries, and complications in tissue reconstruction.
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